Hanwool Semiconductor has secured an order from a Delta Electronics subsidiary for its locally developed MLCC inspection equipment, challenging Japanese dominance and targeting growing quality-control demands in AI server components.
Hanwool Semiconductor has secured an order from a subsidiary of Taiwan’s Delta Electronics group for its locally developed ultrasonic flaw detector for multilayer ceramic capacitors (MLCCs), challenging Japanese dominance in specialised inspection equipment.
The order gives Hanwool a commercial reference as it pursues global customers and could help diversify the supply chain for electronic component inspection equipment, reducing reliance on imports.
The equipment combines ultrasonic non-destructive testing with artificial intelligence (AI) to detect microscopic internal defects without damaging MLCCs. These components are critical to high-reliability applications, including AI servers and data centres, where precise quality control is essential.
Hanwool’s proprietary HaWAIe platform analyses inspection data, classifies internal defects and monitors results in real time. The company plans to improve inspection speed and AI-based judgement to support the transition from sampling checks to 100% inspection.
Hanwool is also conducting specification consultations and equipment tests with global MLCC manufacturers, adapting its systems to customers’ production conditions and quality requirements.
The company is developing an integrated automation system linking component alignment, printed circuit board (PCB) mounting, ultrasonic inspection, AI-based defect judgement and product sorting to improve production efficiency.
A company official said, “We will respond to the transition to 100% inspection in MLCC manufacturing processes by enhancing high-speed ultrasonic inspection and AI automatic judgment technology.”
A representative added, “We plan to expand equipment supply to global customers and broaden our business scope with automation solutions that link pre- and post-inspection processes.”
