- The pilot system has been deployed at ST’s back-end fab in Muar, Malaysia
- The advanced test cell is comprised of Advantest’s T2000 SoC test system and M4841 tri-temp automotive handler, equipped with a fleet of Autonomous Robotic Vehicles (ARVs)
STMicroelectronics and Advantest Corporation have announced that they have jointly developed an advanced, fully-automated final-test cell system that improves overall equipment efficiency and quality in semiconductor test and packaging operations. The pilot system has been deployed at ST’s back-end fab in Muar, Malaysia.
The advanced test cell is comprised of Advantest’s T2000 SoC test system and M4841 tri-temp automotive handler, equipped with a fleet of Autonomous Robotic Vehicles (ARVs). It is programmed to move trays of devices between the material repository and handler, all under the control of an ST Test Cell Controller (STCC). The jointly developed test cell incorporates a broad range of predictive-maintenance and operational features that minimize downtime, while ensuring full lot traceability and smart re-testing.
Automation, analytics, and robotization
Fabio Gualandris, Executive Vice President, Head of STMicroelectronics’ Back-End Manufacturing & Technology organisation said, “We have numerous ongoing projects addressing automation, analytics, and robotization across our global back-end operations, all designed to make our manufacturing processes more efficient and to meet the increasingly complex needs of our customers. The close collaboration with Advantest is a good example of what can be achieved to support a network of fabs that tests billions of chips a year.”
They said that the STCC software monitors and controls the tester and handler while interfacing with ST’s Manufacturing Execution System (MES), a real-time Industry 4.0 tracking system that manages work-in-process and equipment activity across the factory floor. The combination of test-cell hardware and software enables fully automated test operations that apply machine learning and smart monitoring to increase yields and overall equipment effectiveness (OEE), while cutting cost-of-ownership (COO). The companies said that the M4841 handler incorporates a comprehensive set of features, including auto speed optimisation, auto socket cleaning, a belt-tension monitoring, an ESD protection, and multiple laser sensors that detect errors and make autonomous corrections
Yoshiaki Yoshida, Advantest President and CEO said, “Helping our customers achieve a fully ‘lights off’ automated semiconductor test production floor is one of our strategic goals. We are proud to partner with ST on this venture, which enables them to achieve their operational goals of employing ARVs and overhead transport to strategically improve their test-floor efficiencies,” he continued. “Advantest’s test cell is designed for this purpose, with our M4841 handler delivering an abundance of unique intelligent features that give customers a significant advantage in an evolving semiconductor supply chain.”
