PerkinElmer, Covalent Partner To Advance Semiconductor Failure Analysis

The platform can identify corrosion, solder joint degradation and electrical migration issues

PerkinElmer has entered into a strategic collaboration with Covalent to provide advanced analytical instrumentation and analysis services for failure analysis and materials characterisation in the semiconductor, electronics, battery and precision materials industries.

The partnership aims to address growing challenges in identifying the root causes of material failures, component degradation, trace chemical contamination and structural defects by combining PerkinElmer’s analytical technologies with Covalent’s application expertise.

Under the collaboration, the companies will leverage PerkinElmer’s Inductively Coupled Plasma Mass Spectrometry (ICP-MS/MS) and Liquid Chromatography-Tandem Mass Spectrometry (LC-MS/MS) platforms to detect ultra-trace elemental impurities and analyse organic degradation mechanisms. The technologies are expected to enhance manufacturing quality control, accelerate failure analysis and improve raw material characterisation.

“This is an important partnership to help us better understand the analysis challenges facing the semiconductor, electronics and battery industries,” said Paul Davies, Vice President, North America, PerkinElmer. “Covalent’s expertise will help us expand the capabilities of our ICP-MS/MS, LC-MS/MS and other analytical technologies in failure analysis, raw material characterisation, and battery lifetime diagnostics.”

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Craig Hunter, CEO of Covalent, said the collaboration combines advanced analytical instrumentation with application expertise to help customers better understand the mechanisms affecting product performance and reliability.

PerkinElmer said its ICP-MS/MS technology enables ultra-trace analysis of metallic impurities before they contaminate silicon and compound semiconductor wafers. The platform can also identify corrosion, solder joint degradation and electrical migration issues that contribute to failures in printed circuit boards and electronic packages.

Meanwhile, its LC-MS/MS technology supports battery electrolyte degradation profiling and analyses the chemical degradation of coatings and epoxy mould compounds used in electronic components. The technologies are also applicable to impurity profiling, medical device characterisation, and other precision materials applications.

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Nitisha Dubey
Nitisha Dubey
Nitisha Dubey is a journalist at EFY. She focuses on startups and innovations with a deep interest in new technologies and business models.

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